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1 article(s) from Chiriaev, Serguei

Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

Serguei Chiriaev,
Luciana Tavares,
Vadzim Adashkevich,
Arkadiusz J. Goszczak and
Horst-Günter Rubahn

Beilstein J. Nanotechnol. 2020, 11, 1693–1703, doi:10.3762/bjnano.11.151

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Figure 1: (a) AFM image and (b) the corresponding depth profile of a fragment of the surface depression produ...

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Figure 2: Fluence dependence on the irradiation-induced surface depthening for a 5 nm Pt₆₀Pd₄₀/200 nm PMMA sa...

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Figure 3: Helium ion microscopy (HIM) images of a 5 nm Pt₆₀Pd₄₀/200 nm PMMA sample irradiated at a fluence of...

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Figure 4: (a) Optical micrograph of an array of squares produced with He⁺/25 keV FIB in a 15 nm Au/200 nm PMM...

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Figure 5: (a) AFM image and the corresponding depth profile of a part of the surface depression produced in a...

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Figure 6: Fluence dependence of the irradiation-induced depth for the Pt₆₀Pd₄₀/PC sample (red circles). For c...

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Figure 7: HIM images of square (a) and circular (b) arrays produced in 15 nm Pt₆₀Pd₄₀/PDMS samples by irradia...

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Figure 8: Fluence dependence of the irradiation-induced depth for a 15 nm Pt₆₀Pd₄₀/PDMS sample irradiated wit...

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Published 06 Nov 2020

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